Portable Flash Memory Chip Intelligent Test System
The Smart Test System HD-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
HD-N8-NAND supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.
Power supply method
Operating voltage range
AC(220±10%)V single-phase 2-wire + protective earth
Normal working power consumption
Operating temperature range
Storage temperature range
Operating Humidity Range
Number of particles that can be tested in parallel
Supported flash brands for testing
SLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended)
Package sizes supported
BGA152, BGA132 (custom extensions available)
Supported Flash Protocol Types
ONFI/toggle interface particles
Hardware support V1.2, V1.8 optional
Supported Voltage Pull-Off Range
Software support can be fine-tuned vcc2.3~3.6
Supports optional test ranges
Individual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc.
All 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc.
Support for test command types
Flash Memory Information Inspection
Flash Memory Performance Testing
Life Testing and Prediction
Quality Class Classification
Data Interference Testing
Data Retention Testing
Lifetime Testing and Prediction
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