The Smart Test System HD-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
HD-N8-NAND supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.

Technical specifications:

Physical properties
Equipment size	W400×H510×D520mm
Power supply method	AC
Operating voltage range	AC(220±10%)V single-phase 2-wire + protective earth
Normal working power consumption	2KW
Operating temperature range	-30℃~150℃
Storage temperature range	-20℃~60℃
Operating Humidity Range	45%~75%
System performance
Number of particles that can be tested in parallel	1~8 pcs
Supported flash brands for testing	SLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended)
Package sizes supported	BGA152, BGA132 (custom extensions available)
Supported Flash Protocol Types	ONFI/toggle interface particles
Supported Voltage	Hardware support V1.2, V1.8 optional
Supported Voltage Pull-Off Range	Software support can be fine-tuned vcc2.3~3.6 vccq1.2 1.15~1.25 vccq1.8 1.70~1.95
Supports optional test ranges	Individual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc.
Support pattern	All 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc.
Support for test command types	Flash Memory Information Inspection Flash Memory Performance Testing Life Testing and Prediction Quality Class Classification Data Interference Testing Data Retention Testing Read-Retry Functionality Lifetime Testing and Prediction ECC Customisation

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