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SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces
Feature
lSupport the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;
lSupport research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;
lSupport (-70°~+ 180°) test;
lSupport abnormal power failure test and aging test;
lSupport automatic temperature control test;
lSupport all software for intelligent control testing;
lSupport customization of test software;
lSupport the balance of air speed and temperature in the box;
lSupport rapid heating and cooling control;
lSupport customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;
lSupport network control, you can control the test in different places and view the test results;
lSupport APP remote control testing;
Information
Model | HD-72-SATA |
Inner box size | W500×D400×H1020mm |
Outer box size | About W1250×D1350×H1910mm |
volume | 204L |
Opening method | Single door (right open) |
cooling method | air-cooled |
weight | About 930KG |
power supply | AC 220V About 12KW |
Temperature parameter
temperature range | -70℃~150℃ |
Temperature fluctuation | ≤±0.5℃ ≤±1℃ |
temperature offset | ≤±2℃ |
temperature resolution | 0.01℃ |
Heating rate | 5℃/min(mechanical cooling, under standard load) |
temperature change rate | High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load) |
temperature uniformity | ≤±2℃ |
standard load | 10KG aluminum block, 500W load; |
Test standard
GB/T5170.2-2008 Temperature test equipment
GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.
GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.
GJBl50.3 (MIL-STD-810D) high temperature test method.
GJBl50.4 (MIL-STD-810D) low temperature test method. |
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