lSupport the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;

lSupport research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;

lSupport (-70°~+ 180°) test;

lSupport abnormal power failure test and aging test;

lSupport automatic temperature control test;

lSupport all software for intelligent control testing;

lSupport customization of test software;

lSupport the balance of air speed and temperature in the box;

lSupport rapid heating and cooling control;

lSupport customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;

lSupport network control, you can control the test in different places and view the test results;

lSupport APP remote control testing;

Information

Model	HD-72-SATA
Inner box size	W500×D400×H1020mm
Outer box size	About W1250×D1350×H1910mm
volume	204L
Opening method	Single door (right open)
cooling method	air-cooled
weight	About 930KG
power supply	AC 220V About 12KW

Temperature parameter

temperature range	-70℃~150℃
Temperature fluctuation	≤±0.5℃ ≤±1℃
temperature offset	≤±2℃
temperature resolution	0.01℃
Heating rate	5℃/min(mechanical cooling, under standard load)
temperature change rate	High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity	≤±2℃
standard load	10KG aluminum block, 500W load;

Test standard

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.

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